Shiano Ono: search on Z-Library

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1

Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy

Takahashi, Takuji, Ono, Shiano

Journal:

Japanese Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 115 KB

english, 2004

2

Tip-to-sample distance dependence of an electrostatic force in KFM measurements

Takuji Takahashi, Shiano Ono

Journal:

Ultramicroscopy

Year:

2004

Language:

english

File:

PDF, 280 KB

english, 2004

3

Sample-and-hold atomic force microscopy for fast operation

Takuji Takahashi, Shiano Ono

Journal:

Ultramicroscopy

Year:

2005

Language:

english

File:

PDF, 496 KB

english, 2005

4

Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

Shiano Ono, Misaichi Takeuchi, Takuji Takahashi

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 266 KB

english, 2002

5

Improvement of KFM performance by intermittent bias application method and by sampling detection of cantilever deflection

Takuji Takahashi, Tadahisa Matsumoto, Shiano Ono

Journal:

Ultramicroscopy

Year:

2009

Language:

english

File:

PDF, 370 KB

english, 2009

6

Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential

Ono, Shiano, Takahashi, Takuji

Journal:

Japanese Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 97 KB

english, 2006

7

Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates

Takahashi, Takuji, Kawamukai, Takashi, Ono, Shiano, Noda, Takeshi, Sakaki, Hiroyuki

Journal:

Japanese Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 1.02 MB

english, 2000

8

Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy

Ono, Shiano, Takahashi, Takuji

Journal:

Japanese Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 161 KB

english, 2004

9

Vector Field Tomography by Electron Holography

Tsuneta, Ruriko, Ikeda, Masaki, Ono, Shiano, Yamane, Miyuki, Sugawara, Akira, Harada, Ken, Koguchi, Masanari

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.67 MB

english, 2014

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Metrology, Inspection, and Process Control for Microlithography XXV - High-precision edge-roughness measurement of transistor gates using three-dimensional electron microscopy combined with marker-assisted image alignment

Raymond, Christopher J., Ono, Shiano, Yamane, Miyuki, Ogasawara, Mitsuo, Katakami, Akira, Yugami, Jiro, Koguchi, Masanari, Shinada, Hiroyuki, Kakibayashi, Hiroshi, Ikeda, Kazuto, Ohji, Yuzuru

Year:

2011

Language:

english

File:

PDF, 2.16 MB

english, 2011

11

Suppression of Stiction Force by All-Vapor Processes using HF, Ozone, and HMDS for MEMS Devices

Taii, Yusuke, Kakushima, Kuniyuki, Yokokawa, Ryuji, Ono, Shiano, Takahashi, Takuji, Isamoto, Keiji, Chong, Changho, Fujita, Hiroyuki, Toshiyoshi, Hiroshi

Journal:

IEEJ Transactions on Sensors and Micromachines

Year:

2007

Language:

english

File:

PDF, 1.93 MB

english, 2007